May 1992 | Technical Note NIST TN 1355
Transmission/Reflection and Short-Circuit Line Methods for Measuring Permittivity and Permeability
Cite This Publication
James Baker-Jarvis, Michael D. Janezic, John H. Grosvenor Jr., and Richard G. Geyer, “Transmission/Reflection and Short-Circuit Line Methods for Measuring Permittivity and Permeability,” Technical Note NIST TN 1355, U.S. Department of Commerce, National Telecommunications and Information Administration, Institute for Telecommunication Sciences, May 1992. https://doi.org/10.6028/NIST.TN.1355
James Baker-Jarvis, Michael D. Janezic, John H. Grosvenor Jr., and Richard G. Geyer
Abstract:
A transmission/reflection and short-circuit line methods for measuring complex permittivity and permeability of materials in waveguides and coaxial lines are examined. Equations for complex permittivity and permeability are developed from first principles. In addition, new formulations for the determination of complex permittivity and permeability independent of reference plane position are derived. For the one-sample transmission/reflection method and two-position short-circuit line measurements, the solutions are unstable for frequencies where both samples resonate simultaneously. Criteria are given for sample lengths to maintain stability. An optimized solution is also presented for the scattering parameters. This solution is stable over all frequencies and is capable of reducing scattering parameter data on materials with higher dielectric constant. An uncertainty analysis for the various techniques is developed and the results are compared. The errors incurred due to the uncertainty in scattering parameters, length measurement, and reference plane position are used as inputs to the uncertainty models.
Note: This report was revised in December 1993. See doi: 10.6028/NIST.TN.1355r, https://nvlpubs.nist.gov/nistpubs/Legacy/TN/nbstechnicalnote1355r.pdf
Keywords: microwave; coaxial cable; measurement; permeameter
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